Speckle-illumination averaged wide-field reflection phase microscopy

dc.contributor.author	Athira, T. S
dc.contributor.author	Panchal, Pramod
dc.contributor.author	Singh, Rakesh K
dc.contributor.author	Naik, Dinesh N
dc.date.accessioned	2026-09-17T05:17:55Z
dc.date.available	2026-09-17T05:17:55Z
dc.date.issued	2026-08
dc.identifier.citation	Journal of the Optical Society of America A, Vol. 43, No. 8, pp. D38-D43	en_US
dc.identifier.issn	1084-7529
dc.identifier.uri	http://hdl.handle.net/2248/9033
dc.description	Open Access	en_US
dc.description	All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.
dc.description.abstract	An experimental scheme solely employing scalar optics to achieve speckle-illumination averaged wide-field reflection phase microscopy is proposed. The experimental setup utilizes a Sagnac-Linnik Michelson interferometer design, providing greater stability compared to conventional setups. The 3-D/phase imaging of the sample is achieved with reduced speckle noise, wider field of view, and improved resolution.	en_US
dc.language.iso	en	en_US
dc.publisher	Optica Publishing Group	en_US
dc.relation.uri	https://doi.org/10.1364/JOSAA.587767
dc.rights	© 2026 Optica Publishing Group
dc.title	Speckle-illumination averaged wide-field reflection phase microscopy	en_US
dc.type	Article	en_US