Speckle-illumination averaged wide-field reflection phase microscopy

Abstract

An experimental scheme solely employing scalar optics to achieve speckle-illumination averaged wide-field reflection phase microscopy is proposed. The experimental setup utilizes a Sagnac-Linnik Michelson interferometer design, providing greater stability compared to conventional setups. The 3-D/phase imaging of the sample is achieved with reduced speckle noise, wider field of view, and improved resolution.