Abstract:
Upcoming large telescopes are based on Segmented Mirror Telescope (SMT) technology which uses small hexagonal mirror segments placed side by side to form the large monolithic surface. The segments alignment needs to be maintained against external disturbances like wind, gravity, temperature and structural vibration. This is achieved by using three position actuators per segment working at few-nanometer scale range along with a local closed loop controller. The actuator along with a controller is required to meet very stringent performance requirements, such as track rates up to 300nm/s (90mN/s) with tracking errors less than 5nm, dynamical forces of up to ±40N, ability to reject disturbances introduced by the wind as well as by mechanical vibration generated in the mirror cell, etc. To conduct these performance tests in more realistic manner, we have designed and developed a Dynamic Loading Assembly (DLA) at Indian Institute of Astrophysics (IIA), Bangalore. DLA is a computer controlled force-inducing device, designed in a modular fashion to generate different types of user-defined disturbances in extremely precise and controlled manner. Before realizing the device, using a simple spring-mass-damper-based mathematical model, we ensured that the concept would indeed work. Subsequently, simple concept was converted into a detailed mechanical design and parts were manufactured and assembled. DLA has static and dynamic loading capabilities up to 250N and 18N respectively, with a bandwidth sufficient to generate wind disturbances. In this paper, we present various performance requirements of SMT actuators as well as our effort to develop a dynamic loading device which can be used to test these actuators. Well before using DLA for meaningful testing of the actuator, the DLA itself have gone through various tests and improvements phases. We have successfully demonstrated that DLA can be used to check the extreme performance of two different SMT actuators, which are expected to track the position/force with a few nanometer accuracy.