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http://hdl.handle.net/2248/9033| Title: | Speckle-illumination averaged wide-field reflection phase microscopy |
| Authors: | Athira, T. S Panchal, Pramod Singh, Rakesh K Naik, Dinesh N |
| Issue Date: | Aug-2026 |
| Publisher: | Optica Publishing Group |
| Citation: | Journal of the Optical Society of America A, Vol. 43, No. 8, pp. D38-D43 |
| Abstract: | An experimental scheme solely employing scalar optics to achieve speckle-illumination averaged wide-field reflection phase microscopy is proposed. The experimental setup utilizes a Sagnac-Linnik Michelson interferometer design, providing greater stability compared to conventional setups. The 3-D/phase imaging of the sample is achieved with reduced speckle noise, wider field of view, and improved resolution. |
| Description: | Open Access All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved. |
| URI: | http://hdl.handle.net/2248/9033 |
| ISSN: | 1084-7529 |
| Appears in Collections: | IIAP Publications |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Speckle-illumination averaged wide-field reflection phase microscopy.pdf | 3.41 MB | Adobe PDF | View/Open |
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