Speckle-illumination averaged wide-field reflection phase microscopy

Please use this identifier to cite or link to this item: http://hdl.handle.net/2248/9033

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DC Field	Value	Language
dc.contributor.author	Athira, T. S	-
dc.contributor.author	Panchal, Pramod	-
dc.contributor.author	Singh, Rakesh K	-
dc.contributor.author	Naik, Dinesh N	-
dc.date.accessioned	2026-09-17T05:17:55Z	-
dc.date.available	2026-09-17T05:17:55Z	-
dc.date.issued	2026-08	-
dc.identifier.citation	Journal of the Optical Society of America A, Vol. 43, No. 8, pp. D38-D43	en_US
dc.identifier.issn	1084-7529	-
dc.identifier.uri	http://hdl.handle.net/2248/9033	-
dc.description	Open Access	en_US
dc.description	All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.	-
dc.description.abstract	An experimental scheme solely employing scalar optics to achieve speckle-illumination averaged wide-field reflection phase microscopy is proposed. The experimental setup utilizes a Sagnac-Linnik Michelson interferometer design, providing greater stability compared to conventional setups. The 3-D/phase imaging of the sample is achieved with reduced speckle noise, wider field of view, and improved resolution.	en_US
dc.language.iso	en	en_US
dc.publisher	Optica Publishing Group	en_US
dc.relation.uri	https://doi.org/10.1364/JOSAA.587767	-
dc.rights	© 2026 Optica Publishing Group	-
dc.title	Speckle-illumination averaged wide-field reflection phase microscopy	en_US
dc.type	Article	en_US
Appears in Collections:	IIAP Publications

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