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Scatter studies for visible emission line coronagraph on board ADITYA-L1 mission

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dc.contributor.author Venkata Suresh, Narra
dc.contributor.author Prasad, B. R
dc.contributor.author Raj Kumar, Nalla
dc.contributor.author Singh, J
dc.date.accessioned 2020-11-17T14:01:26Z
dc.date.available 2020-11-17T14:01:26Z
dc.date.issued 2017-01
dc.identifier.citation Journal of Astronomical Telescopes, Instruments, and Systems, Vol. 3, No. 1, pp. 014002-1 - 014002-7 en_US
dc.identifier.issn 2329-4221
dc.identifier.uri http://prints.iiap.res.in/handle/2248/7102
dc.description Restricted Access © SPIE--The International Society for Optical Engineering http://dx.doi.org/10.1117/1.JATIS.3.1.014002 en_US
dc.description.abstract Visible emission line coronagraph (VELC) on board ADITYA-L1 mission is an internally occulted mirror coronagraph designed for solar coronal observations over a field of view (FOV) of 1.05 Ro to 3 Ro. To achieve the proposed science goals, instrument background should be less than 5 ppm over the FOV of VELC. Major contributor toward instrument background is scatter from surface microroughness and particulate contamination over the primary mirror (M1). Hence, a detailed study of scatter through simulations is carried out to arrive at the surface microroughness specifications and surface cleanliness level requirements of M1. Estimation of RMS microroughness correction factor due to finite band width of the profilometer is very important while specifying the RMS microroughness of M1. This paper discusses in detail about scatter simulations, results, and analysis. All simulations are carried out using Advanced System Analysis Program, developed by Breault Research Organization. en_US
dc.language.iso en en_US
dc.publisher SPIE-The International Society for Optical Engineering en_US
dc.subject Total integrated scatter en_US
dc.subject RMS microroughness en_US
dc.subject Band limited integrated scatter en_US
dc.subject Scatter simulations en_US
dc.subject Bidirectional scatter distribution function en_US
dc.subject Particulate contamination en_US
dc.subject Cleanliness level en_US
dc.subject Advance system analysis program en_US
dc.title Scatter studies for visible emission line coronagraph on board ADITYA-L1 mission en_US
dc.type Article en_US


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