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A relativistic equation-of-motion coupled-cluster investigation of the trends of single and double ionization potentials in the He and Be isoelectronic systems

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dc.contributor.author Pathak, H
dc.contributor.author Sahoo, B. K
dc.contributor.author Sengupta, Turbasu
dc.contributor.author Das, B. P
dc.contributor.author Vaval, N
dc.contributor.author Pal, S
dc.date.accessioned 2020-11-12T15:22:59Z
dc.date.available 2020-11-12T15:22:59Z
dc.date.issued 2015-06
dc.identifier.citation Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 48, No. 11, 115009 en_US
dc.identifier.issn 0953-4075
dc.identifier.uri http://prints.iiap.res.in/handle/2248/6983
dc.description Restricted Access © IOP Publishing Ltd http://dx.doi.org/10.1088/0953-4075/48/11/115009 en_US
dc.description.abstract We employ a four-component spinor relativistic equation-of-motion coupled-cluster (EOMCC) method within the single- and double- excitation approximation to calculate the single ionization potentials (IPs) and double ionization potentials (DIPs) of the He and Be isoelectronic sequences up to Ne. The obtained results are compared with the available results from the National Institute of Standards and Technology (NIST) database to test the performance of the EOMCC method. We also present intermediate results at different levels of approximations in the EOMCC framework to gain insight of the effect of electron correlation. Furthermore, we investigate the dependence of the IPs and DIPs of these ions on the ionic charge and observe that these follow parabolic trends. Similarities between the trends of IPs and DIPs in both the classes of considered systems are categorically demonstrated. en_US
dc.language.iso en en_US
dc.publisher IOP Publishing en_US
dc.subject Double ionization potentials en_US
dc.subject Equation-of-motion theory en_US
dc.subject Coupled-cluster method en_US
dc.title A relativistic equation-of-motion coupled-cluster investigation of the trends of single and double ionization potentials in the He and Be isoelectronic systems en_US
dc.type Article en_US


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