| dc.contributor.author | Pandya, T. P | |
| dc.contributor.author | Saxena, A. K | |
| dc.date.accessioned | 2009-11-05T11:29:53Z | |
| dc.date.available | 2009-11-05T11:29:53Z | |
| dc.date.issued | 1979-03 | |
| dc.identifier.citation | Review of Scientific Instruments, Vol. 50, No. 3, pp. 369 - 373 | en |
| dc.identifier.issn | 0034-6748 | |
| dc.identifier.uri | http://hdl.handle.net/2248/4893 | |
| dc.description | Restricted Access | |
| dc.description.abstract | A theory for determining one-dimensional ray deflections with the help of distorted Babinet fringes has been developed. An approach for investigating two-dimensional ray deflections has been presented. Applications of the techniques for the study of gradient index glass have been described. | en |
| dc.language.iso | en | en |
| dc.publisher | American Institute of Physics | en |
| dc.relation.uri | http://dx.doi.org/10.1063/1.1135830 | en |
| dc.rights | © American Institute of Physics | en |
| dc.subject | Gradient Index | en |
| dc.subject | Babinet Fringe Analysis | en |
| dc.subject | Optical Assembly | |
| dc.title | Measurement of gradient index profiles by babinet fringe analysis | en |
| dc.type | Article | en |