Sanders, W. T; Henry, R. C; Bregman, J. N; Cen, R; Cox, D. P; Croft, R. A. C; Hammond, E. C; Hurwitz, M. V; McKee, C; Kimble, R. A; Porter, F. S; Serlemitsos, P. J; Stahle, C. K; Murthy, J; Raymond, J. C; Smith, R. K; Szymkowiak, A. E
(SPIE--The International Society for Optical Engineering., 2003-03)