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http://hdl.handle.net/2248/7997
Title: | Method for tilt correction of calibration lines in high-resolution spectra |
Authors: | Das, Tanya Banyal, R. K |
Issue Date: | 1-Nov-2021 |
Publisher: | Optical Society of America |
Citation: | Applied Optics, Vol. 60, No. 31 pp. 9906-9914 |
Abstract: | Technological advancement has led to improvement in the design capabilities of astronomical spectrographs, allowing for high-precision spectroscopy, thereby expanding the realms of observational astronomy. High-resolution spectrographs use echelle gratings that operate in higher orders, giving more detailed spectra. Often, curvature and tilted lines are observed in the spectra, arising due to the design trade-offs of the respective spectrographs. Removal of these artifacts can help avoid wrong flux calculation and line centroid position misinterpretation, which can aid in a better prediction of the wavelength calibration model. In this paper we present a postprocessing technique that we developed to correct the observed curvature and tilt in the spectra. We have demonstrated the correction technique on Fabry–Perot and Th-Ar calibration spectra obtained from a Hanle echelle spectrograph, a Magellan Inamori Kyocera Echelle spectrometer, and a X-Shooter spectrograph. |
Description: | Restricted Access |
URI: | http://hdl.handle.net/2248/7997 |
ISSN: | 2155-3165 |
Appears in Collections: | IIAP Publications |
Files in This Item:
File | Description | Size | Format | |
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Method for tilt correction of calibration lines in high-resolution spectra.pdf Restricted Access | 17.26 MB | Adobe PDF | View/Open Request a copy |
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