Please use this identifier to cite or link to this item: http://hdl.handle.net/2248/7708
Full metadata record
DC FieldValueLanguage
dc.contributor.authorVentaka, S-
dc.contributor.authorPrasad, B. R-
dc.contributor.authorNatarajan, V-
dc.contributor.authorKamath, P. U-
dc.contributor.authorKathiravan, S-
dc.date.accessioned2021-06-25T13:31:17Z-
dc.date.available2021-06-25T13:31:17Z-
dc.date.issued2020-08-
dc.identifier.citationOptical Engineering, Vol. 59, No. 8, pp. 084106-1 - 084106-16en_US
dc.identifier.issn1560-2303-
dc.identifier.urihttp://hdl.handle.net/2248/7708-
dc.descriptionRestricted Accessen_US
dc.description.abstractScattering of light from a surface depends on its microroughness. In general, total integrated scattering of a surface is expressed in terms of root-mean-square microroughness (σrms) using empirical relations. These empirical relations assume that the σrms is measured over the spatial scales ranging from 0 to surface length/diameter (L). In reality, σrms will be measured over finite spatial lengths/scales that result in band-limited microroughness (σbl) and hence bandlimited integrated scatter (BLIS). BLIS depends on the microroughness of surface over the finite spatial bandwidths rather than infinite spatial scales. Scatter from super polished optical mirrors peaks in specular direction and falls off exponentially. Hence, BLIS measurements in nearspecular direction provide crucial information in understanding the relation between surface microroughness and scatter. Our work gives a detailed description of BLIS measurements carried out on super polished optical surfaces with different surface microroughness and a comparison between the scatter and surface microroughness measurements.en_US
dc.language.isoenen_US
dc.publisherSPIE-The International Society for Optical Engineeringen_US
dc.relation.urihttps://doi.org/10.1117/1.OE.59.8.084106-
dc.rights© SPIE--The International Society for Optical Engineering-
dc.subjectTotal integrated scatteringen_US
dc.subjectBand-limited integrated scatteren_US
dc.subjectRoot-mean-square microroughnessen_US
dc.subjectSpatial scalesen_US
dc.titleBand-limited integrated scatter measurements on super polished optical mirrorsen_US
dc.typeArticleen_US
Appears in Collections:IIAP Publications

Files in This Item:
File Description SizeFormat 
Band-limited integrated scatter measurements on super polished optical mirrors.pdf
  Restricted Access
4.31 MBAdobe PDFView/Open Request a copy


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.