Please use this identifier to cite or link to this item:
http://hdl.handle.net/2248/4893| Title: | Measurement of gradient index profiles by babinet fringe analysis |
| Authors: | Pandya, T. P Saxena, A. K |
| Keywords: | Gradient Index Babinet Fringe Analysis Optical Assembly |
| Issue Date: | Mar-1979 |
| Publisher: | American Institute of Physics |
| Citation: | Review of Scientific Instruments, Vol. 50, No. 3, pp. 369 - 373 |
| Abstract: | A theory for determining one-dimensional ray deflections with the help of distorted Babinet fringes has been developed. An approach for investigating two-dimensional ray deflections has been presented. Applications of the techniques for the study of gradient index glass have been described. |
| Description: | Restricted Access |
| URI: | http://hdl.handle.net/2248/4893 |
| ISSN: | 0034-6748 |
| Appears in Collections: | IIAP Publications |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Measurement of gradient index profiles by babinet fringe analysis Restricted Access | Restricted Access | 660.72 kB | Adobe PDF | View/Open Request a copy |
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